A Unified Data Representation Learning for Non-parametric Two-sample Testing
Tian, X., etal. "A Unified Data Representation Learning for Non-parametric Two-sample Testing". arXiv preprint arXiv:2412.00613 (2025)
Tian, X., etal. "A Unified Data Representation Learning for Non-parametric Two-sample Testing". arXiv preprint arXiv:2412.00613 (2025)
Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA, USA
Talk at London School of Testing, London, UK
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley, CA, USA
Talk at UC San Francisco, Department of Testing, San Francisco, CA, USA